Advanced Analytical Tools

In the hands of highly trained Noel technicians, advanced, spectral reflectivity analysis tools are used to measure and characterize semiconductor thin films. Bow, warp and flatness are monitored to ensure wafer integrity is maintained during thermal cycling. Wafers are tested for resistivity and batch sorted for thickness in 5µ increments. Particle counts on wafers with thin film are measured at a mean of 0.40µ.

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